Nextest Magnum EV 2 Automated Memory Tester (A# 71404)

泰瑞达的Magnum2测试系统为高性能“非易失性”存储器、静态RAM存储器和逻辑器件提供高产能和高并行测试效率。,NEXTEST/TERADYNEMagnumIIEV是一款高性能的生產級測試設備，用於測試印刷電路板上的元件和零件。它具有自動化的測試開發、HIL能力、無錯誤布線、高速掃描和...。參考影片的文章的如下：

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Definitive Guide To Regular Expressions - Basic Regex Tryout
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Regular Expressions (RegEx) Tutorial #13 - Testing a RegEx Pattern

參考內容推薦

Magnum 2

泰瑞达的Magnum 2 测试系统为高性能“非易失性”存储器、静态RAM 存储器和逻辑器件提供高产能和高并行测试效率。

二手NEXTEST TERADYNE Magnum II EV #9194856 待售

NEXTEST/TERADYNE Magnum II EV是一款高性能的生產級測試設備，用於測試印刷電路板上的元件和零件。它具有自動化的測試開發、HIL能力、無錯誤布線、高速掃描和故障識別 ...

二手NEXTEST TERADYNE Magnum SSV #9045630 待售

NEXTEST和NEXTEST/TERADYNE Magnum SSV是為高速、高通量半導體測試而設計的工業測試系統,具有開放的體系結構、可配置的測試頭、高性能調試單元和易於配置的控制系統。

Nextest Magnum II EV Automated Memory Tester

Nextest Magnum II EV Automated Memory Tester - Operating system: Windows Server 2003 SP2 - Software version: h3.10.7C - Voltage: 120/240 - 1 phase

NEXTEST Magnum 1 PV Tester

供應中 Fully operational tester configured as following. Just removed from test floor in late 2022. 512 Pins populated (max 640 pins capability). 4 site assembly ...

Products

Precision tribology test equipment. Machines ranging from general purpose test requirements to application specific requirements.

Teradyne Magnum 5 EV Memory Tester | ATE

Find the reliable legacy Teradyne Magnum 5 EV ATE 2018 vintage equipment at SurplusGLOBAL. We buy and sell legacy semiconductor equipment globally.

Teradyne Magnum SSV Memory Tester | ATE

Find the reliable legacy Teradyne Magnum SSV ATE 2005 vintage equipment at SurplusGLOBAL. We buy and sell legacy semiconductor equipment globally.

Magnum V for NAND Testing

Teradyne's Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance NAND Flash testing and DRAM memories.

magnumtester

泰瑞达的Magnum2测试系统为高性能“非易失性”存储器、静态RAM存储器和逻辑器件提供高产能和高并行测试效率。,NEXTEST/TERADYNEMagnumIIEV是一款高性能的生產級測試設備，用於測試印刷電路板上的元件和零件。它具有自動化的測試開發、HIL能力、無錯誤布線、高速掃描和故障識別 ...,NEXTEST和NEXTEST/TERADYNEMagnumSSV是為高速、高通量半導體測試而設計的工業測試系統,具有開放的體系結構、可配置的測試頭、高性能調試單元和易於...

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